Corrigendum to “Increasing electrocatalytic efficiency of CuO/CoMn₂O₄ nanocomposite for oxygen evolution reaction” [Ceram. Int. 49 (2023) 28071–28079, (S0272884223016309), (10.1016/j.ceramint.2023.06.056)]

The authors regret they have identified several issues concerning visual presentation of specific figures in this article. These discrepancies stem from post–processing operations that inadvertently altered fidelity of original data. While underlying scientific conclusions remain unaffected, the authors believe it is imperative to rectify these issues to uphold accuracy and transparency of published record. Specific corrections are as follows: We would like to address an error in SEM micrographs published in our article. Due to a copy-pasting mistake, scale bar was incorrectly applied, resulting in all micrographs displaying a representative scale of 500 nm, (now describing otiginal scales). This issue arose from a student error during the process. Additionally, there was an incorrect exchange of Figs. 1b and c. The high-resolution micrograph intended for Fig. 1b was mistakenly placed in Figure 1c, and vice versa. Moreover, Figs. 1a and b need to be swapped. The previous Figure 1c (now Figure 1a) was intended as low-resolution image, while previous Fig. 1a (now Fig. 1b) was meant to be high-resolution image. We also wish to clarify an error in manuscript regarding SEM model used. The manuscript incorrectly stated (due to copy paste error) that analysis was conducted on a NanoNova SEM 450, while actual analysis was performed using Vega3 TESCAN instrument. We sincerely apologize for this oversight, as it may cause confusion for readers. We are submitting this corrigendum to correct the mistake and clarify intended figure placements. Upon re-examination, the authors discovered that Energy Dispersive X–ray Spectroscopy (EDS) data presented in Fig. 1(g–i) had undergone processing in OriginPro software, which introduced slight distortions to elemental distribution profiles. These modifications were unintentional and arose from default rendering parameters applied during image export. The authors have now prepared corrected versions of these subfigures using original, unprocessed datasets to accurately reflect compositional analysis.[Figure presented] In Fig. 2, the authors initially applied smoothing and baseline correction algorithms to enhance clarity of X–ray Diffraction (XRD) spectrum. However, upon reflection, they recognize that these processing steps inadvertently altered the true shape and intensity of diffraction peaks. To preserve scientific accuracy, they have generated a revised figure that displays raw XRD data without any post–processing modifications.[Figure presented] This version provides a more precise depiction of material's crystallographic features as originally measured. Similarly, in Fig. 3, Fourier Transform Infrared (FTIR) spectrum was subjected to smoothing and background subtraction. While the intent was to improve spectral readability, the result unintentionally introduced deviations from the actual spectral response. The authors corrected this figure to ensure that readers can interpret vibrational features without influence of data smoothening, and baseline corrections.[Figure presented] As a consequence of correction to Fig. 1, the authors have also revised Fig. 8. This figure incorporates data from XRD analysis originally presented in Fig. 1, alongside comparative XRD spectra post–stability testing. Earlier version included processed spectra; however, the authors now provide unprocessed, raw XRD plots for both datasets to maintain consistency and data transparency. The updated figure reflects authentic diffraction patterns as recorded during experiments, both before and after the stability tests.[Figure presented] The authors would like to sincerely apologize for any inconvenience this may have caused to the readers or reviewers. We deeply regret any confusion or disruption that may have arisen as a result and assure you that we are committed to maintaining the highest standards of academic integrity and diligence in all our future work.