Abstract
The authors regret that in this published article they observed the XRD spectrum inserted is processed via baseline correction and has caused slight deviation from the original XRD spectrum, thus they wanted to have the original graph presented for the reader to better understand the XRD of sample. The correct versions are shown below (see Figs. 1 and 2).[Formula presented] As for the EDS analysis, the authors have supplied the spectrum with correct labels, which initially was mislabelled, due to some error. Neither of these changes will affect the scientific results and no change is needed to the discussion.[Formula presented] The authors would like to apologise for any inconvenience caused. [Formula presented] We would also like to address the pre and post stability structural analysis in Fig. 6f. The analysis for the enhanced understanding for the reader of the journal.
Original language | English |
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Pages (from-to) | 41992-41995 |
Number of pages | 4 |
Journal | Ceramics International |
Volume | 50 |
Issue number | 21 |
DOIs |
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State | Published - 1 Nov 2024 |
Externally published | Yes |
Bibliographical note
Publisher Copyright:© 2024
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Process Chemistry and Technology
- Surfaces, Coatings and Films
- Materials Chemistry