Corrigendum to “Effect on physiochemical assets of Dy added spinel ZnSm₂O₄ for energy storage applications” [Ceram. Int. 49 (2023) 28036–28047, (S0272884223016243), (10.1016/j.ceramint.2023.06.051)]

The authors regret that in the originally published Fig. 2, data presented for X–ray Diffraction (XRD) and Fourier–Transform Infrared Spectroscopy (FTIR) analyses were processed using smoothening and baseline correction techniques via OriginPro software. While such processing aimed to enhance visualization, it inadvertently introduced deviations from raw data, which may lead to potential confusion or misinterpretation. To ensure clarity and maintain integrity of scientific communication, we hereby provide revised version of Fig. 2, where both Fig. 2a-b present original (raw) unprocessed XRD and FTIR data, respectively.[Figure presented] Upon careful review, it was noted that Scanning Electron Microscopy (SEM) micrograph labelled as 20% Dy–doped ZnSm₂O₄ sample was mistakenly replaced with SEM image of undoped ZnSm₂O₄ sample. The authors sincerely regret this oversight. The corrected Fig. 3 now contains an accurate SEM micrograph corresponding to the 20% Dy-doped ZnSm₂O₄ sample, along with all other samples, having their intended SEM micrographs, properly depicting intended morphology. Importantly, these corrections pertain solely to visual representations and do not affect the scientific results, analysis, or discussion presented in manuscript. Overall conclusions of article remain valid and unchanged.[Figure presented] The authors would like to sincerely apologize for any inconvenience this may have caused and will ensure greater attention in the future.