Corrigendum to “Comprehensive analysis of Ni0.4Cu0.2Zn0.4Fe2-4xSn3xO4 nanospinel ferrites: Structural, electrical, and dielectric characterization through advanced techniques” [Ceram. Int. 50 (2024) 30670-30682, (S0272884224022491), (10.1016/j.ceramint.2024.05.367)]

B. Ünal; M. A. Almessiere; A. Baykal; Y. Slimani; M. A. Gondal; N. Kian-Pour; Sagar E. Shirsath; A. Manikandan; U. Baig

doi:10.1016/j.ceramint.2025.05.390

Corrigendum to “Comprehensive analysis of Ni0.4Cu0.2Zn0.4Fe2-4xSn3xO4 nanospinel ferrites: Structural, electrical, and dielectric characterization through advanced techniques” [Ceram. Int. 50 (2024) 30670-30682, (S0272884224022491), (10.1016/j.ceramint.2024.05.367)]

B. Ünal
, M. A. Almessiere^*
, A. Baykal
, Y. Slimani
, M. A. Gondal
, N. Kian-Pour
, Sagar E. Shirsath
, A. Manikandan
, U. Baig

^*Corresponding author for this work

Research output: Contribution to journal › Comment/debate

Abstract

While reviewing our published article, we discovered an unintentional error in one of the SEM images corresponding to the sample with x = 0.04 in Fig. 2. We would like to clarify that this error does not affect any of the results, discussions, or conclusions presented in the paper. The corrected version of Fig. 2 is provided below for your kind consideration. The authors would like to apologise for any inconvenience caused.[Figure

Original language	English
Pages (from-to)	37978-37979
Number of pages	2
Journal	Ceramics International
Volume	51
Issue number	22
DOIs	https://doi.org/10.1016/j.ceramint.2025.05.390
State	Published - Sep 2025

Bibliographical note

Publisher Copyright:
© 2025 Elsevier Ltd and Techna Group S.r.l.

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Process Chemistry and Technology
Surfaces, Coatings and Films
Materials Chemistry

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Ünal, B., Almessiere, M. A., Baykal, A., Slimani, Y., Gondal, M. A., Kian-Pour, N., Shirsath, S. E., Manikandan, A., & Baig, U. (2025). Corrigendum to “Comprehensive analysis of Ni0.4Cu0.2Zn0.4Fe2-4xSn3xO4 nanospinel ferrites: Structural, electrical, and dielectric characterization through advanced techniques” [Ceram. Int. 50 (2024) 30670-30682, (S0272884224022491), (10.1016/j.ceramint.2024.05.367)]. Ceramics International, 51(22), 37978-37979. https://doi.org/10.1016/j.ceramint.2025.05.390

Ünal, B. ; Almessiere, M. A. ; Baykal, A. et al. / Corrigendum to “Comprehensive analysis of Ni0.4Cu0.2Zn0.4Fe2-4xSn3xO4 nanospinel ferrites : Structural, electrical, and dielectric characterization through advanced techniques” [Ceram. Int. 50 (2024) 30670-30682, (S0272884224022491), (10.1016/j.ceramint.2024.05.367)]. In: Ceramics International. 2025 ; Vol. 51, No. 22. pp. 37978-37979.

@article{f9082648e0fd4be8b6002a3418badee4,

title = "Corrigendum to “Comprehensive analysis of Ni0.4Cu0.2Zn0.4Fe2-4xSn3xO4 nanospinel ferrites: Structural, electrical, and dielectric characterization through advanced techniques” [Ceram. Int. 50 (2024) 30670-30682, (S0272884224022491), (10.1016/j.ceramint.2024.05.367)]",

abstract = "While reviewing our published article, we discovered an unintentional error in one of the SEM images corresponding to the sample with x = 0.04 in Fig. 2. We would like to clarify that this error does not affect any of the results, discussions, or conclusions presented in the paper. The corrected version of Fig. 2 is provided below for your kind consideration. The authors would like to apologise for any inconvenience caused.[Figure",

author = "B. {\"U}nal and Almessiere, \{M. A.\} and A. Baykal and Y. Slimani and Gondal, \{M. A.\} and N. Kian-Pour and Shirsath, \{Sagar E.\} and A. Manikandan and U. Baig",

note = "Publisher Copyright: {\textcopyright} 2025 Elsevier Ltd and Techna Group S.r.l.",

year = "2025",

month = sep,

doi = "10.1016/j.ceramint.2025.05.390",

language = "English",

volume = "51",

pages = "37978--37979",

journal = "Ceramics International",

issn = "0272-8842",

publisher = "Elsevier Ltd.",

number = "22",

}

Ünal, B, Almessiere, MA, Baykal, A, Slimani, Y, Gondal, MA, Kian-Pour, N, Shirsath, SE, Manikandan, A & Baig, U 2025, 'Corrigendum to “Comprehensive analysis of Ni0.4Cu0.2Zn0.4Fe2-4xSn3xO4 nanospinel ferrites: Structural, electrical, and dielectric characterization through advanced techniques” [Ceram. Int. 50 (2024) 30670-30682, (S0272884224022491), (10.1016/j.ceramint.2024.05.367)]', Ceramics International, vol. 51, no. 22, pp. 37978-37979. https://doi.org/10.1016/j.ceramint.2025.05.390

Corrigendum to “Comprehensive analysis of Ni0.4Cu0.2Zn0.4Fe2-4xSn3xO4 nanospinel ferrites: Structural, electrical, and dielectric characterization through advanced techniques” [Ceram. Int. 50 (2024) 30670-30682, (S0272884224022491), (10.1016/j.ceramint.2024.05.367)]. / Ünal, B.; Almessiere, M. A.; Baykal, A. et al.
In: Ceramics International, Vol. 51, No. 22, 09.2025, p. 37978-37979.

Research output: Contribution to journal › Comment/debate

TY - JOUR

T1 - Corrigendum to “Comprehensive analysis of Ni0.4Cu0.2Zn0.4Fe2-4xSn3xO4 nanospinel ferrites

T2 - Structural, electrical, and dielectric characterization through advanced techniques” [Ceram. Int. 50 (2024) 30670-30682, (S0272884224022491), (10.1016/j.ceramint.2024.05.367)]

AU - Ünal, B.

AU - Almessiere, M. A.

AU - Baykal, A.

AU - Slimani, Y.

AU - Gondal, M. A.

AU - Kian-Pour, N.

AU - Shirsath, Sagar E.

AU - Manikandan, A.

AU - Baig, U.

PY - 2025/9

Y1 - 2025/9

N2 - While reviewing our published article, we discovered an unintentional error in one of the SEM images corresponding to the sample with x = 0.04 in Fig. 2. We would like to clarify that this error does not affect any of the results, discussions, or conclusions presented in the paper. The corrected version of Fig. 2 is provided below for your kind consideration. The authors would like to apologise for any inconvenience caused.[Figure

AB - While reviewing our published article, we discovered an unintentional error in one of the SEM images corresponding to the sample with x = 0.04 in Fig. 2. We would like to clarify that this error does not affect any of the results, discussions, or conclusions presented in the paper. The corrected version of Fig. 2 is provided below for your kind consideration. The authors would like to apologise for any inconvenience caused.[Figure

UR - https://www.scopus.com/pages/publications/105007539521

U2 - 10.1016/j.ceramint.2025.05.390

DO - 10.1016/j.ceramint.2025.05.390

M3 - Comment/debate

AN - SCOPUS:105007539521

SN - 0272-8842

VL - 51

SP - 37978

EP - 37979

JO - Ceramics International

JF - Ceramics International

IS - 22

ER -

Ünal B, Almessiere MA, Baykal A, Slimani Y, Gondal MA, Kian-Pour N et al. Corrigendum to “Comprehensive analysis of Ni0.4Cu0.2Zn0.4Fe2-4xSn3xO4 nanospinel ferrites: Structural, electrical, and dielectric characterization through advanced techniques” [Ceram. Int. 50 (2024) 30670-30682, (S0272884224022491), (10.1016/j.ceramint.2024.05.367)]. Ceramics International. 2025 Sep;51(22):37978-37979. doi: 10.1016/j.ceramint.2025.05.390