Correlated hopping through thin disordered insulators

  • D. Ephron*
  • , M. R. Beasley
  • , H. Bahlouli
  • , K. A. Matveev
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

We present data from Mo/a-Si/Mo tunnel junctions together with calculations that show that hopping transport via localized states in amorphous silicon is highly correlated. Localized states whose single-particle energies lie well below the Fermi level participate in transport due to the large on-site Coulomb interaction U. The results also imply that the density of these states is roughly constant over a wide energy range of order U.

Original languageEnglish
Pages (from-to)2989-2992
Number of pages4
JournalPhysical Review B
Volume49
Issue number4
DOIs
StatePublished - 1994
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics

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