Abstract
Adv. Electron. Mater. 2022, 8, 2101124 DOI: 10.1002/aelm.202101124 There is an error in Figure 2 in the original published version of the article (https://doi.org/10.1002/aelm.202101124). One SEM (x = 0.035) was unintentionally zoomed from another image. Fortunately, none of the other results were affected by this unintentional error. The corrected version of Figure 2 is attached. Original figure: Corrected figure: Figure 2. SEM images of SrBaSc/NiFe H/S (x ≤ 0.035) NCs.
Original language | English |
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Journal | Advanced Electronic Materials |
DOIs |
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State | Accepted/In press - 2024 |
Bibliographical note
Publisher Copyright:© 2024 The Author(s). Advanced Electronic Materials published by Wiley-VCH GmbH.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials