Abstract
It is demonstrated that the silicon atom dangling bond (DB) state serves as a quantum dot. Coulomb repulsion causes DBs separated by □ 2nm to exhibit reduced localized charge, which enables electron tunnel coupling of DBs. Scanning tunneling microscopy measurements and theoretical modeling reveal that fabrication geometry of multi-DB assemblies determines net occupation and tunnel coupling strength among dots. Electron occupation of DB assemblies can be controlled at room temperature. Electrostatic control over charge distribution within assemblies is demonstrated.
| Original language | English |
|---|---|
| Article number | 046805 |
| Journal | Physical Review Letters |
| Volume | 102 |
| Issue number | 4 |
| DOIs | |
| State | Published - 26 Jan 2009 |
| Externally published | Yes |
ASJC Scopus subject areas
- General Physics and Astronomy
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