Abstract
The research reported in this paper was conducted to identify those attributes, of both sequential circuits and structural, sequential automatic test pattern generation (ATPG) algorithms, which can lead to extremely high test generation times. The retiming transformation is used as a mechanism to create two classes of circuits which present varying degrees of complexity for test generation. It was observed for three different sequential test generators that the increase in complexity of testing is not due to those circuit attributes (namely sequential depth and cycles) which have traditionally been associated with such complexity. Evidence is instead provided that another circuit attribute, termed density of encoding, is a key indicator of the complexity of structural, sequential ATPG.
| Original language | English |
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| Title of host publication | Proceedings of the 1995 European Conference on Design and Test, EDTC 1995 |
| Publisher | Association for Computing Machinery, Inc |
| Pages | 252-261 |
| Number of pages | 10 |
| ISBN (Electronic) | 0818670398, 9780818670398 |
| DOIs | |
| State | Published - 6 Mar 1995 |
| Externally published | Yes |
Publication series
| Name | Proceedings of the 1995 European Conference on Design and Test, EDTC 1995 |
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Bibliographical note
Funding Information:This work has been supported by the Semiconductor Research Corp under contract no. 94-DC-068, Intel, a Cooperative Research and Development Grant from the “National Sciences and Engineering Research Council of Canada”, Bell Northern Research, and a scholarship from the Quebec “Fonds pour la Formation de Chercheurs et I’ Aide a la Recherche”.
ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering