Complexity of Sequential ATPG

Thomas E. Marchok; Aiman El-Maleh; Wojciech Maly; Janusz Rajski

doi:10.1109/EDTC.1995.470387

Complexity of Sequential ATPG

Thomas E. Marchok
, Aiman El-Maleh
, Wojciech Maly
, Janusz Rajski

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

The research reported in this paper was conducted to identify those attributes, of both sequential circuits and structural, sequential automatic test pattern generation (ATPG) algorithms, which can lead to extremely high test generation times. The retiming transformation is used as a mechanism to create two classes of circuits which present varying degrees of complexity for test generation. It was observed for three different sequential test generators that the increase in complexity of testing is not due to those circuit attributes (namely sequential depth and cycles) which have traditionally been associated with such complexity. Evidence is instead provided that another circuit attribute, termed density of encoding, is a key indicator of the complexity of structural, sequential ATPG.

Original language	English
Title of host publication	European Design and Test Conference, ED and TC 1995 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	252-261
Number of pages	10
ISBN (Electronic)	0818670398, 9780818670398
DOIs	https://doi.org/10.1109/EDTC.1995.470387
State	Published - 1995
Externally published	Yes
Event	1995 European Design and Test Conference, ED and TC 1995 - Paris, France Duration: 6 Mar 1995 → 9 Mar 1995

Publication series

Name	European Design and Test Conference, ED and TC 1995 - Proceedings

Conference

Conference	1995 European Design and Test Conference, ED and TC 1995
Country/Territory	France
City	Paris
Period	6/03/95 → 9/03/95

Bibliographical note

Publisher Copyright:
© 1995 IEEE.

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Control and Optimization
Instrumentation

Access to Document

10.1109/EDTC.1995.470387

Cite this

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title = "Complexity of Sequential ATPG",

abstract = "The research reported in this paper was conducted to identify those attributes, of both sequential circuits and structural, sequential automatic test pattern generation (ATPG) algorithms, which can lead to extremely high test generation times. The retiming transformation is used as a mechanism to create two classes of circuits which present varying degrees of complexity for test generation. It was observed for three different sequential test generators that the increase in complexity of testing is not due to those circuit attributes (namely sequential depth and cycles) which have traditionally been associated with such complexity. Evidence is instead provided that another circuit attribute, termed density of encoding, is a key indicator of the complexity of structural, sequential ATPG.",

author = "Marchok, \{Thomas E.\} and Aiman El-Maleh and Wojciech Maly and Janusz Rajski",

note = "Publisher Copyright: {\textcopyright} 1995 IEEE.; 1995 European Design and Test Conference, ED and TC 1995 ; Conference date: 06-03-1995 Through 09-03-1995",

year = "1995",

doi = "10.1109/EDTC.1995.470387",

language = "English",

series = "European Design and Test Conference, ED and TC 1995 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "252--261",

booktitle = "European Design and Test Conference, ED and TC 1995 - Proceedings",

address = "United States",

}

Marchok, TE, El-Maleh, A, Maly, W & Rajski, J 1995, Complexity of Sequential ATPG. in European Design and Test Conference, ED and TC 1995 - Proceedings. European Design and Test Conference, ED and TC 1995 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 252-261, 1995 European Design and Test Conference, ED and TC 1995, Paris, France, 6/03/95. https://doi.org/10.1109/EDTC.1995.470387

Complexity of Sequential ATPG. / Marchok, Thomas E.; El-Maleh, Aiman; Maly, Wojciech et al.
European Design and Test Conference, ED and TC 1995 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 1995. p. 252-261 (European Design and Test Conference, ED and TC 1995 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Complexity of Sequential ATPG

AU - Marchok, Thomas E.

AU - El-Maleh, Aiman

AU - Maly, Wojciech

AU - Rajski, Janusz

PY - 1995

Y1 - 1995

N2 - The research reported in this paper was conducted to identify those attributes, of both sequential circuits and structural, sequential automatic test pattern generation (ATPG) algorithms, which can lead to extremely high test generation times. The retiming transformation is used as a mechanism to create two classes of circuits which present varying degrees of complexity for test generation. It was observed for three different sequential test generators that the increase in complexity of testing is not due to those circuit attributes (namely sequential depth and cycles) which have traditionally been associated with such complexity. Evidence is instead provided that another circuit attribute, termed density of encoding, is a key indicator of the complexity of structural, sequential ATPG.

AB - The research reported in this paper was conducted to identify those attributes, of both sequential circuits and structural, sequential automatic test pattern generation (ATPG) algorithms, which can lead to extremely high test generation times. The retiming transformation is used as a mechanism to create two classes of circuits which present varying degrees of complexity for test generation. It was observed for three different sequential test generators that the increase in complexity of testing is not due to those circuit attributes (namely sequential depth and cycles) which have traditionally been associated with such complexity. Evidence is instead provided that another circuit attribute, termed density of encoding, is a key indicator of the complexity of structural, sequential ATPG.

UR - https://www.scopus.com/pages/publications/105051120478

U2 - 10.1109/EDTC.1995.470387

DO - 10.1109/EDTC.1995.470387

M3 - Conference contribution

AN - SCOPUS:105051120478

T3 - European Design and Test Conference, ED and TC 1995 - Proceedings

SP - 252

EP - 261

BT - European Design and Test Conference, ED and TC 1995 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 1995 European Design and Test Conference, ED and TC 1995

Y2 - 6 March 1995 through 9 March 1995

ER -

Complexity of Sequential ATPG

Abstract

Publication series

Conference

Bibliographical note

ASJC Scopus subject areas

Access to Document

Fingerprint

Cite this