Abstract
Thin films were produced by the reactive thermal evaporation of pure silver oxide (AgO) in a background of molecular oxygen. The effects of the deposition rate and oxygen partial pressure on the structural, chemical, electrical and optical properties of the films were investigated. The films were characterized using x-ray diffraction, x-ray photoelectron spectroscopy, electrical resistivity and normal-incidence transmittance and reflectance. The resulting films were found to be mainly metallic with a small oxide component that increased with the oxygen partial pressure.
| Original language | English |
|---|---|
| Article number | 027 |
| Pages (from-to) | 2847-2853 |
| Number of pages | 7 |
| Journal | Journal of Physics D: Applied Physics |
| Volume | 40 |
| Issue number | 9 |
| DOIs | |
| State | Published - 7 May 2007 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Acoustics and Ultrasonics
- Surfaces, Coatings and Films