Abstract
The chemical bath deposition method was used to synthesize Eu-doped ZnO on p-type (100) silicon. The SEM image shows the formation of micropod-like ZnO. EDX and XPS measurements showed an increase in the Eu concentration up to 2.54% and the simultaneous presence of Eu 3+ and Eu 2+. XRD analysis confirmed that the interstitial Eu 3+ ions distorted the four tetrahedral bonds, and the substitution of Eu 2+ ions increased the c lattice parameter. Only Eu 3+ 5D 0→ 7F 2 transition-related emission was observed, so a weak transfer energy from the ZnO matrix to the Eu ion occurred. However, the competition between the emission of deep-level defects in the host matrix and that of Eu 3+ ions deforms the visible emission towards the red color. The I–V measurements of the Eu-ZnO/p-Si heterojunctions showed diode-like behavior with a low rectification ratio and a barrier height around 0.84 eV not affected by the Eu concentration.
| Original language | English |
|---|---|
| Article number | 110874 |
| Journal | Vacuum |
| Volume | 198 |
| DOIs | |
| State | Published - Apr 2022 |
Bibliographical note
Funding Information:The authors take this opportunity to thank the Department of Physics, College of Science at Zulfi, Majmaah University, specifically Dr. Ibrahim Shaarany, for helpful technical assistance with equipment facilities.
Publisher Copyright:
© 2022 Elsevier Ltd
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