Characterization of a thin film of Al2O3 by SEM/EDS analysis

Research output: Contribution to specialist publicationArticle

1 Scopus citations

Abstract

Scanning Electron microscopy (SEM) was used to observe a thin electron transparent anodic Al2O3 film that existed on the surface of a potentiodynamically-polarized Al alloy 5052 containing 0.3wt% Sc. The oxide film was characterized by energy dispersive X-ray analysis using different accelerating voltages.

Original languageEnglish
Pages93-98
Number of pages6
Volume49
No3
Specialist publicationCorrosion Prevention and Control
StatePublished - Sep 2002

ASJC Scopus subject areas

  • Metals and Alloys

Fingerprint

Dive into the research topics of 'Characterization of a thin film of Al2O3 by SEM/EDS analysis'. Together they form a unique fingerprint.

Cite this