Research output: Patent
}
TY - PAT
T1 - Apparatus and Method for Failure Detection
AU - El-Ferik, Sami
AU - Elferik, Sami
AU - Adeniran, Ahmed Adebowale Adebowale
AU - Adegoke, Muideen Adeniyi
AU - Al-Naser, Mustafa
PY - 2022
Y1 - 2022
M3 - Patent
M1 - US11435734
ER -