Annealing Effects on the Structural and Optical Properties of Thermally Deposited Tin Antimony Sulfide Thin Films

N. Ali; R. Ahmed; A. Shaari; I. Rahim; M. Shah; A. Hussain; N. Ahmad; S. M. Abbas

doi:10.1007/s13538-014-0255-1

Annealing Effects on the Structural and Optical Properties of Thermally Deposited Tin Antimony Sulfide Thin Films

N. Ali^*, R. Ahmed, A. Shaari, I. Rahim, M. Shah, A. Hussain, N. Ahmad, S. M. Abbas

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

We report the deposition and characterization of tin antimony sulfide thin films on a soda glass substrate by a thermal evaporation technique. The thin films were annealed in argon gas at 150, 175, and 300 °C inside glass ampoules. The structural and optical properties of the deposited and annealed films are investigated. X-ray diffraction (XRD) patterns show that the films are polycrystalline in structure. Photoconductivity plot revealed good response in the NIR and visible regions, while the films show no transmittance below 700 nm. The absorption coefficient was of the order of 10⁶ cm⁻¹. Optical band gaps were also evaluated and a decrease in band gap was observed due to annealing. Hot point probe technique was employed for type of conductivity.

Original language	English
Pages (from-to)	733-738
Number of pages	6
Journal	Brazilian Journal of Physics
Volume	44
Issue number	6
DOIs	https://doi.org/10.1007/s13538-014-0255-1
State	Published - Dec 2014
Externally published	Yes

Bibliographical note

Publisher Copyright:
© 2014, Sociedade Brasileira de Física.

Keywords

Absorption coefficient
Annealing
Solar cell
Transmittance
XRD

ASJC Scopus subject areas

General Physics and Astronomy

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1007/s13538-014-0255-1

Cite this

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title = "Annealing Effects on the Structural and Optical Properties of Thermally Deposited Tin Antimony Sulfide Thin Films",

abstract = "We report the deposition and characterization of tin antimony sulfide thin films on a soda glass substrate by a thermal evaporation technique. The thin films were annealed in argon gas at 150, 175, and 300 °C inside glass ampoules. The structural and optical properties of the deposited and annealed films are investigated. X-ray diffraction (XRD) patterns show that the films are polycrystalline in structure. Photoconductivity plot revealed good response in the NIR and visible regions, while the films show no transmittance below 700 nm. The absorption coefficient was of the order of 106 cm−1. Optical band gaps were also evaluated and a decrease in band gap was observed due to annealing. Hot point probe technique was employed for type of conductivity.",

keywords = "Absorption coefficient, Annealing, Solar cell, Transmittance, XRD",

author = "N. Ali and R. Ahmed and A. Shaari and I. Rahim and M. Shah and A. Hussain and N. Ahmad and Abbas, \{S. M.\}",

note = "Publisher Copyright: {\textcopyright} 2014, Sociedade Brasileira de F{\'i}sica.",

year = "2014",

month = dec,

doi = "10.1007/s13538-014-0255-1",

language = "English",

volume = "44",

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journal = "Brazilian Journal of Physics",

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TY - JOUR

T1 - Annealing Effects on the Structural and Optical Properties of Thermally Deposited Tin Antimony Sulfide Thin Films

AU - Ali, N.

AU - Ahmed, R.

AU - Shaari, A.

AU - Rahim, I.

AU - Shah, M.

AU - Hussain, A.

AU - Ahmad, N.

AU - Abbas, S. M.

PY - 2014/12

Y1 - 2014/12

N2 - We report the deposition and characterization of tin antimony sulfide thin films on a soda glass substrate by a thermal evaporation technique. The thin films were annealed in argon gas at 150, 175, and 300 °C inside glass ampoules. The structural and optical properties of the deposited and annealed films are investigated. X-ray diffraction (XRD) patterns show that the films are polycrystalline in structure. Photoconductivity plot revealed good response in the NIR and visible regions, while the films show no transmittance below 700 nm. The absorption coefficient was of the order of 106 cm−1. Optical band gaps were also evaluated and a decrease in band gap was observed due to annealing. Hot point probe technique was employed for type of conductivity.

AB - We report the deposition and characterization of tin antimony sulfide thin films on a soda glass substrate by a thermal evaporation technique. The thin films were annealed in argon gas at 150, 175, and 300 °C inside glass ampoules. The structural and optical properties of the deposited and annealed films are investigated. X-ray diffraction (XRD) patterns show that the films are polycrystalline in structure. Photoconductivity plot revealed good response in the NIR and visible regions, while the films show no transmittance below 700 nm. The absorption coefficient was of the order of 106 cm−1. Optical band gaps were also evaluated and a decrease in band gap was observed due to annealing. Hot point probe technique was employed for type of conductivity.

KW - Absorption coefficient

KW - Annealing

KW - Solar cell

KW - Transmittance

KW - XRD

UR - https://www.scopus.com/pages/publications/84919902969

U2 - 10.1007/s13538-014-0255-1

DO - 10.1007/s13538-014-0255-1

M3 - Article

AN - SCOPUS:84919902969

SN - 0103-9733

VL - 44

SP - 733

EP - 738

JO - Brazilian Journal of Physics

JF - Brazilian Journal of Physics

IS - 6

ER -

Annealing Effects on the Structural and Optical Properties of Thermally Deposited Tin Antimony Sulfide Thin Films

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

UN SDGs

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