TY - GEN
T1 - Analog performance prediction based on archimedean copulas generation algorithm
AU - Beznia, Kamel
AU - Bounceur, Ahcène
AU - Euler, Reinhardt
PY - 2011
Y1 - 2011
N2 - Testing analog circuits is a complex and very time consuming task. In contrary to digital circuits, testing analog circuits needs different configurations, each of them targets a certain set of output parameters which are the performances and the test measures. One of the solutions to simplify the test task and optimize test time is the reduction of the number of to-be-tested performances by eliminating redundant ones. However, the main problem with such a solution is the identification of redundant performances. Traditional methods based on calculation of the correlation between different performances or on the defect level are shown to be not sufficient. This paper presents a new method based on the Archimedean copula generation algorithm. It predicts the performance value from each output parameter value based on the dependence (copula) between the two values. Therefore, different performances can be represented by a single output parameter; as a result, less test configurations are required. To validate the proposed approach, a CMOS imager with two performances and one test measure is used. The simulation results show that the two performances can be replaced by a single test measure. Industrial results are also reported to prove the superiority of the proposed approach. 1
AB - Testing analog circuits is a complex and very time consuming task. In contrary to digital circuits, testing analog circuits needs different configurations, each of them targets a certain set of output parameters which are the performances and the test measures. One of the solutions to simplify the test task and optimize test time is the reduction of the number of to-be-tested performances by eliminating redundant ones. However, the main problem with such a solution is the identification of redundant performances. Traditional methods based on calculation of the correlation between different performances or on the defect level are shown to be not sufficient. This paper presents a new method based on the Archimedean copula generation algorithm. It predicts the performance value from each output parameter value based on the dependence (copula) between the two values. Therefore, different performances can be represented by a single output parameter; as a result, less test configurations are required. To validate the proposed approach, a CMOS imager with two performances and one test measure is used. The simulation results show that the two performances can be replaced by a single test measure. Industrial results are also reported to prove the superiority of the proposed approach. 1
UR - https://www.scopus.com/pages/publications/84857606692
U2 - 10.1109/IDT.2011.6123095
DO - 10.1109/IDT.2011.6123095
M3 - Conference contribution
AN - SCOPUS:84857606692
SN - 9781467304689
T3 - International Design and Test Workshop
SP - 18
EP - 23
BT - 2011 IEEE 6th International Design and Test Workshop, IDT 2011
T2 - 2011 IEEE 6th International Design and Test Workshop, IDT 2011
Y2 - 11 December 2011 through 14 December 2011
ER -