An LO Double Edge-Tuning IQ Imbalance Calibration Technique for Modern-Day Transceivers

Hussam Alshammary*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper presents an on-chip in phase (I) and quadrature (Q) imbalance technique that improves the error vector magnitude (EVM) and residual side band (RSB) for transmit and receive front-ends. By tuning the delay of the rising and/or falling edge of local oscillator (LO) waveforms, this technique achieves gain adjustment and phase shift correction, effectively negating hardware mismatch without requiring additional circuitry. This novel approach improves the raw residual side band (RSB) before the analog-to-digital converter (ADC), thereby relaxing the signal-to-noise and distortion ratio (SNDR) requirement. The proposed approach is discussed in theory and verified with 180nm CMOS process at 1GHz achieving an EVM floor of better than -73dB with 64QAM modulation corresponding to an image rejection ratio improvement of more than 30dB. When the proposed calibration technique is enabled, the RF front-end's total power consumption varies by less than ±0.15 mW, depending on the calibration code, with an active area that is three orders of magnitude smaller than state-of-the-art solutions.

Original languageEnglish
Title of host publication2024 31st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350377200
DOIs
StatePublished - 2024
Event31st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2024 - Nancy, France
Duration: 18 Nov 202420 Nov 2024

Publication series

NameProceedings of the IEEE International Conference on Electronics, Circuits, and Systems
ISSN (Print)2994-5755
ISSN (Electronic)2995-0589

Conference

Conference31st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2024
Country/TerritoryFrance
CityNancy
Period18/11/2420/11/24

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

Keywords

  • CMOS
  • Carrier Aggregation (CA)
  • Error vector magnitude (EVM)
  • IQ calibration
  • IQ mis-match
  • Image Rejection Ratio (IRR)
  • Residual-side band (RSB)
  • Transceivers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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