Abstract
Virtually, detection of shifts in the dispersion parameter of the process is more valuable before monitoring the location parameter of the process. For the monitoring of the dispersion parameter, the S 2 chart is a common choice in the literature. In this paper, we proposed a modified S 2 chart based on modified successive sampling, which is cost effective relative to simple random sampling. The run length properties are used as comparative measure and the findings depict that all proposed schemes outperform the classical S 2 chart. Finally, the application of the proposed scheme is demonstrated using a real-life engineering process.
| Original language | English |
|---|---|
| Article number | 8047928 |
| Pages (from-to) | 19486-19493 |
| Number of pages | 8 |
| Journal | IEEE Access |
| Volume | 5 |
| DOIs | |
| State | Published - 20 Sep 2017 |
Bibliographical note
Publisher Copyright:© 2013 IEEE.
Keywords
- Average run length
- control chart
- cost optimization
- modified successive sampling
- process dispersion
- statistical process control
ASJC Scopus subject areas
- General Computer Science
- General Materials Science
- General Engineering
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