TY - GEN
T1 - An error-detection and self-repairing method for dynamically and partially reconfigurable systems
AU - Reorda, Matteo Sonza
AU - Sterpone, Luca
AU - Ullah, Anees
PY - 2013
Y1 - 2013
N2 - Reconfigurable systems are gaining an increasing interest in the domain of safety-critical applications, for example in space and avionic applications. In fact, the capability of reconfiguring the system during run-time execution and the high computational power of modern Field Programmable Gate Arrays (FPGAs) makes these devices suitable for data processing. Moreover, such systems must also guarantee the abilities of self-awareness, self-diagnosis and self-repair in order to cope with errors due to the harsh conditions typically existing in some environments. In this paper we propose a self-repairing method for partially and dynamically reconfigurable systems applied at a fine-grain granularity level. Our method is able to recover and correct errors using the run-time partial reconfiguration capabilities offered by modern SRAM-based FPGAs. Fault injection experiments have been executed on a dynamically reconfigurable system embedding a number of benchmark circuits. Results demonstrate that the method can achieve full detection of single and multiple errors, while significantly improving the system availability with respect to traditional error detection and correction methods.
AB - Reconfigurable systems are gaining an increasing interest in the domain of safety-critical applications, for example in space and avionic applications. In fact, the capability of reconfiguring the system during run-time execution and the high computational power of modern Field Programmable Gate Arrays (FPGAs) makes these devices suitable for data processing. Moreover, such systems must also guarantee the abilities of self-awareness, self-diagnosis and self-repair in order to cope with errors due to the harsh conditions typically existing in some environments. In this paper we propose a self-repairing method for partially and dynamically reconfigurable systems applied at a fine-grain granularity level. Our method is able to recover and correct errors using the run-time partial reconfiguration capabilities offered by modern SRAM-based FPGAs. Fault injection experiments have been executed on a dynamically reconfigurable system embedding a number of benchmark circuits. Results demonstrate that the method can achieve full detection of single and multiple errors, while significantly improving the system availability with respect to traditional error detection and correction methods.
KW - Multiple Bit Upsets (MBUs)
KW - Partial and Dynamic Reconfiguration
KW - Self-Repair
KW - Single Event Upsets (SEUs)
UR - https://www.scopus.com/pages/publications/84883429331
U2 - 10.1109/ETS.2013.6569377
DO - 10.1109/ETS.2013.6569377
M3 - Conference contribution
AN - SCOPUS:84883429331
SN - 9781467363778
T3 - Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013
BT - Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013
T2 - 2013 18th IEEE European Test Symposium, ETS 2013
Y2 - 27 May 2013 through 30 May 2013
ER -