Abstract
Field-programmable gate array (FPGA)-based single-event upset (SEU) emulation in user flip-flops is essential for reliability evaluation of mapped designs. Previous approaches to inject SEUs in user flip-flops utilized the configuration memory bits that control the set and reset settings of the flip-flops. In contrast, this paper presents a novel approach for SEU emulation in user flip-flops contents through single-frame on-chip partial reconfiguration (PR). The presented methodology exploits the inherent architectural features of the latest Xilinx FPGAs to support state initialization of flip-flops during PR. The proposed approach does not require instrumentation overhead for flip-flops and reduces the fault-injection times by orders of magnitude.
| Original language | English |
|---|---|
| Pages (from-to) | 989-996 |
| Number of pages | 8 |
| Journal | IEEE Transactions on Nuclear Science |
| Volume | 65 |
| Issue number | 4 |
| DOIs | |
| State | Published - Apr 2018 |
Bibliographical note
Publisher Copyright:© 1963-2012 IEEE.
Keywords
- Fault injection
- radiation effects
- reliability evaluations
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Electrical and Electronic Engineering
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