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An Efficient Methodology for On-Chip SEU Injection in Flip-Flops for Xilinx FPGAs

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

Field-programmable gate array (FPGA)-based single-event upset (SEU) emulation in user flip-flops is essential for reliability evaluation of mapped designs. Previous approaches to inject SEUs in user flip-flops utilized the configuration memory bits that control the set and reset settings of the flip-flops. In contrast, this paper presents a novel approach for SEU emulation in user flip-flops contents through single-frame on-chip partial reconfiguration (PR). The presented methodology exploits the inherent architectural features of the latest Xilinx FPGAs to support state initialization of flip-flops during PR. The proposed approach does not require instrumentation overhead for flip-flops and reduces the fault-injection times by orders of magnitude.

Original languageEnglish
Pages (from-to)989-996
Number of pages8
JournalIEEE Transactions on Nuclear Science
Volume65
Issue number4
DOIs
StatePublished - Apr 2018

Bibliographical note

Publisher Copyright:
© 1963-2012 IEEE.

Keywords

  • Fault injection
  • radiation effects
  • reliability evaluations

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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