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An AdaBoost Ensemble Model for Fault Detection and Classification in Photovoltaic Arrays

  • Ehtisham Lodhi
  • , Fei Yue Wang
  • , Gang Xiong*
  • , Adil Dilawar
  • , Tariku Sinshaw Tamir
  • , Hub Ali
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

41 Scopus citations

Abstract

The photovoltaic (PV) arrays are susceptible to numerous faults. Fault diagnosis is essential in improving a PV system's output power, reliability, and life span. This research paper suggests an AdaBoost Ensemble Model (AEM) approach for detecting and classifying PV system faults. The AEM approach includes several weak base learners stacked sequentially so that they learn from the mistakes of prior weak learners to produce an improved predictive model. This study considers open-circuit fault (OCF), short-circuit fault (SCF), and degradation fault (DF). A complete quantitative evaluation of the suggested AEM approach is compared to earlier machine learning classification techniques to diagnose faults in PV arrays. The results of the proposed AEM approach are superior to those of the traditional methods, with an accuracy of 97.84 percent in fault detection. The findings indicate that the AEM approach improves classification performance while preserving a powerful generalization capability for PV system fault diagnostics. Consequently, the proposed AEM approach is more effective at detecting and classifying faults in PV array systems.

Original languageEnglish
Pages (from-to)794-800
Number of pages7
JournalIEEE Journal of Radio Frequency Identification
Volume6
DOIs
StatePublished - 2022
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 7 - Affordable and Clean Energy
    SDG 7 Affordable and Clean Energy

Keywords

  • AdaBoost ensemble model (AEM)
  • Photovoltaic (PV)
  • degradation fault (DF)
  • fault classification
  • fault detection
  • machine learning
  • open-circuit fault (OCF)
  • short-circuit fault (SCF)

ASJC Scopus subject areas

  • Instrumentation
  • Computer Networks and Communications

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