Abstract
The photovoltaic (PV) arrays are susceptible to numerous faults. Fault diagnosis is essential in improving a PV system's output power, reliability, and life span. This research paper suggests an AdaBoost Ensemble Model (AEM) approach for detecting and classifying PV system faults. The AEM approach includes several weak base learners stacked sequentially so that they learn from the mistakes of prior weak learners to produce an improved predictive model. This study considers open-circuit fault (OCF), short-circuit fault (SCF), and degradation fault (DF). A complete quantitative evaluation of the suggested AEM approach is compared to earlier machine learning classification techniques to diagnose faults in PV arrays. The results of the proposed AEM approach are superior to those of the traditional methods, with an accuracy of 97.84 percent in fault detection. The findings indicate that the AEM approach improves classification performance while preserving a powerful generalization capability for PV system fault diagnostics. Consequently, the proposed AEM approach is more effective at detecting and classifying faults in PV array systems.
| Original language | English |
|---|---|
| Pages (from-to) | 794-800 |
| Number of pages | 7 |
| Journal | IEEE Journal of Radio Frequency Identification |
| Volume | 6 |
| DOIs | |
| State | Published - 2022 |
| Externally published | Yes |
Bibliographical note
Publisher Copyright:© 2017 IEEE.
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- AdaBoost ensemble model (AEM)
- Photovoltaic (PV)
- degradation fault (DF)
- fault classification
- fault detection
- machine learning
- open-circuit fault (OCF)
- short-circuit fault (SCF)
ASJC Scopus subject areas
- Instrumentation
- Computer Networks and Communications
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