All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate

  • L. Y. Chan
  • , K. K. Qureshi
  • , P. K.A. Wai*
  • , B. Moses
  • , L. F.K. Lui
  • , H. Y. Tam
  • , M. S. Demokan
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

74 Scopus citations

Abstract

A novel all-optical bit-error monitoring system is demonstrated by cascading two all-optical logic gates: an inverted wavelength converter and an optical NOR gate which are realized using injection-locked laser diodes operating at different thresholds. Real-time optical monitoring signal is generated which indicates the positions and duration of both bit and burst errors in 10-Gb/s nonreturn-to-zero signals.

Original languageEnglish
Pages (from-to)593-595
Number of pages3
JournalIEEE Photonics Technology Letters
Volume15
Issue number4
DOIs
StatePublished - Apr 2003
Externally publishedYes

Bibliographical note

Funding Information:
Manuscript received October 28, 2002; revised December 13, 2002. This work was supported by the Research Grant Council of the Hong Kong Special Administrative Region, China, under Project PolyU 5132/99E.

Keywords

  • Bit-error monitoring
  • Injection locking
  • Optical data processing
  • Optical logic gate

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate'. Together they form a unique fingerprint.

Cite this