Abstract
The disinfection industry would greatly benefit from efficient, robust, high-power deep-ultraviolet light-emitting diodes (UV-C LEDs). However, the performance of UV-C AlGaN LEDs is limited by poor light-extraction efficiency (LEE) and the presence of a large density of threading dislocations. We demonstrate high power AlGaN LEDs grown on SiC with high LEE and low threading dislocation density. We employ a crack-free AlN buffer layer with low threading dislocation density and a technique to fabricate thin-film UV LEDs by removing the SiC substrate, with a highly selective SF6 etch. The LEDs (278 nm) have a turn-on voltage of 4.3 V and a CW power of 8 mW (82 mW/mm2) and external quantum efficiency (EQE) of 1.8% at 95 mA. KOH submicron roughening of the AlN surface (nitrogen-polar) and improved p-contact reflectivity are found to be effective in improving the LEE of UV light. We estimate the improved LEE by semiempirical calculations to be 33% (without encapsulation). This work establishes UV LEDs grown on SiC substrates as a viable architecture to large-area, high-brightness, and high-power UV LEDs.
| Original language | English |
|---|---|
| Pages (from-to) | 554-561 |
| Number of pages | 8 |
| Journal | ACS Photonics |
| Volume | 7 |
| Issue number | 3 |
| DOIs | |
| State | Published - 18 Mar 2020 |
| Externally published | Yes |
Bibliographical note
Publisher Copyright:Copyright © 2020 American Chemical Society.
Keywords
- AlGaN LEDs
- AlN
- SiC
- UV-C LEDs
- disinfection technology
- external quantum efficiency
- light extraction efficiency
- substrate removal
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Biotechnology
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering
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