Abstract
Recently we introduced a new method which we call the Extended Sampling Method to compute the eigenvalues of second order SturmLiouville problems with eigenvalue dependent potential. We shall see in this paper how we use this method to compute the eigenvalues of fourth order SturmLiouville problems and present its practical use on a few examples.
| Original language | English |
|---|---|
| Pages (from-to) | 3064-3071 |
| Number of pages | 8 |
| Journal | Journal of Computational and Applied Mathematics |
| Volume | 234 |
| Issue number | 10 |
| DOIs | |
| State | Published - 15 Sep 2010 |
Keywords
- Eigenvalue problems
- Extended Sampling Method
- Fourth order SturmLiouville problems
- Regularized Sampling Method
ASJC Scopus subject areas
- Computational Mathematics
- Applied Mathematics