@inproceedings{c103920e46b542f8bf6ed7a636303649,
title = "A six-port reflectometer with a variable test port impedance suitable for non linear microwave device characterization",
abstract = "A description is given of a six-port reflectometer with a variable test port impedance. The six-port junction was specially designed to allow the variation of the test port impedance over almost all of the Smith chart. Such a reflectometer is found suitable for active nonlinear microwave oscillator characterization such as microwave source pull/load pull oscillator measurements, and device line measurements of negative resistance one port terminal devices.",
author = "Ghannouchi, \{Fadhel M.\} and Bosisio, \{Renato G.\}",
year = "1991",
month = may,
language = "English",
isbn = "0879425792",
series = "Conference Record - IEEE Instrumentation and Measurement Technology Conference",
publisher = "Publ by IEEE",
pages = "180--182",
editor = "Anon",
booktitle = "Conference Record - IEEE Instrumentation and Measurement Technology Conference",
}