A scheme of test data compression based on coding of even bits marking and selective output inversion

Wenfa Zhan; Huaguo Liang; Cuiyun Jiang; Zhengfeng Huang; Aiman El-Maleh

doi:10.1016/j.compeleceng.2010.01.002

A scheme of test data compression based on coding of even bits marking and selective output inversion

Wenfa Zhan^*, Huaguo Liang, Cuiyun Jiang, Zhengfeng Huang, Aiman El-Maleh

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

A new scheme of test data compression/decompression, namely coding of even bits marking and selective output inversion, is presented. It first uses a special kind of codewords, odd bits of which are used to represent the length of runs and even bits of which are used to represent whether the codewords finish. The characteristic of the codewords make the structure of decompressor simple. It then introduces a structure of selective output inversion to increase the probability of 0s. This scheme can obtain a better compression ratio than some already known schemes, but it only needs a very low hardware overhead. The performance of the scheme is experimentally confirmed on the larger examples of the ISCAS89 benchmark circuits.

Original language	English
Pages (from-to)	969-977
Number of pages	9
Journal	Computers and Electrical Engineering
Volume	36
Issue number	5
DOIs	https://doi.org/10.1016/j.compeleceng.2010.01.002
State	Published - Sep 2010

Bibliographical note

Funding Information:
The authors would like to thank Prof. Nur A. Touba, who is at the Department of Electrical and Computer Engineering, University of Texas at Austin, and Prof. Krishnendu Chakrabarty, who is at the Department of Electrical and Computer Engineering, Duke University, for their suggestions to revise this paper. This work is supported in part by the National Natural Science Foundation of China (Nos. 90407008 and 60633060), and Scientific Research Foundation for Excellent Youth Scholars of high institutions in Anhui Province (No. 2010SQRL110).

Keywords

Stimulus compression
System-on-a-chip (SoC)
Test
Test data compression
Test vector

ASJC Scopus subject areas

Control and Systems Engineering
General Computer Science
Electrical and Electronic Engineering

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10.1016/j.compeleceng.2010.01.002

Cite this

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title = "A scheme of test data compression based on coding of even bits marking and selective output inversion",

abstract = "A new scheme of test data compression/decompression, namely coding of even bits marking and selective output inversion, is presented. It first uses a special kind of codewords, odd bits of which are used to represent the length of runs and even bits of which are used to represent whether the codewords finish. The characteristic of the codewords make the structure of decompressor simple. It then introduces a structure of selective output inversion to increase the probability of 0s. This scheme can obtain a better compression ratio than some already known schemes, but it only needs a very low hardware overhead. The performance of the scheme is experimentally confirmed on the larger examples of the ISCAS89 benchmark circuits.",

keywords = "Stimulus compression, System-on-a-chip (SoC), Test, Test data compression, Test vector",

author = "Wenfa Zhan and Huaguo Liang and Cuiyun Jiang and Zhengfeng Huang and Aiman El-Maleh",

note = "Funding Information: The authors would like to thank Prof. Nur A. Touba, who is at the Department of Electrical and Computer Engineering, University of Texas at Austin, and Prof. Krishnendu Chakrabarty, who is at the Department of Electrical and Computer Engineering, Duke University, for their suggestions to revise this paper. This work is supported in part by the National Natural Science Foundation of China (Nos. 90407008 and 60633060), and Scientific Research Foundation for Excellent Youth Scholars of high institutions in Anhui Province (No. 2010SQRL110).",

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AU - Huang, Zhengfeng

AU - El-Maleh, Aiman

N1 - Funding Information: The authors would like to thank Prof. Nur A. Touba, who is at the Department of Electrical and Computer Engineering, University of Texas at Austin, and Prof. Krishnendu Chakrabarty, who is at the Department of Electrical and Computer Engineering, Duke University, for their suggestions to revise this paper. This work is supported in part by the National Natural Science Foundation of China (Nos. 90407008 and 60633060), and Scientific Research Foundation for Excellent Youth Scholars of high institutions in Anhui Province (No. 2010SQRL110).

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N2 - A new scheme of test data compression/decompression, namely coding of even bits marking and selective output inversion, is presented. It first uses a special kind of codewords, odd bits of which are used to represent the length of runs and even bits of which are used to represent whether the codewords finish. The characteristic of the codewords make the structure of decompressor simple. It then introduces a structure of selective output inversion to increase the probability of 0s. This scheme can obtain a better compression ratio than some already known schemes, but it only needs a very low hardware overhead. The performance of the scheme is experimentally confirmed on the larger examples of the ISCAS89 benchmark circuits.

AB - A new scheme of test data compression/decompression, namely coding of even bits marking and selective output inversion, is presented. It first uses a special kind of codewords, odd bits of which are used to represent the length of runs and even bits of which are used to represent whether the codewords finish. The characteristic of the codewords make the structure of decompressor simple. It then introduces a structure of selective output inversion to increase the probability of 0s. This scheme can obtain a better compression ratio than some already known schemes, but it only needs a very low hardware overhead. The performance of the scheme is experimentally confirmed on the larger examples of the ISCAS89 benchmark circuits.

KW - Stimulus compression

KW - System-on-a-chip (SoC)

KW - Test

KW - Test data compression

KW - Test vector

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A scheme of test data compression based on coding of even bits marking and selective output inversion

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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