Abstract
In this study a Shewhart type control chart namely the V t chart, is proposed for improved monitoring of the process variability of a quality characteristic of interest Y. The proposed control chart is based on the ratio type estimator of the variance using a single auxiliary variable X. It is assumed that (Y, X) follows a bivariate normal distribution. The design structure of the V t chart is developed for Phase-I quality control and its comparison is made with those of the S 2 chart (a well-known Shewhart control chart) and the V r chart (a Shewhart type control chart proposed by Riaz (Comput Stat, 2008a) used for the same purpose. It is observed that the proposed V t chart outperforms the S 2 and V r charts, in terms of discriminatory power, for detecting moderate to large shifts in the process variability. It is observed that the performance of the V t chart keeps improving with an increase in |ρ yx | , where ρ yx is the correlation between Y and X.
| Original language | English |
|---|---|
| Pages (from-to) | 345-368 |
| Number of pages | 24 |
| Journal | Computational Statistics |
| Volume | 24 |
| Issue number | 2 |
| DOIs | |
| State | Published - May 2009 |
| Externally published | Yes |
Keywords
- Auxiliary information
- Normality
- Power curves
- S charts
- Simulations
- V chart
- V chart
ASJC Scopus subject areas
- Statistics and Probability
- Statistics, Probability and Uncertainty
- Computational Mathematics
Fingerprint
Dive into the research topics of 'A process variability control chart'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver