A new probe for non-contact measurement of radius and roundness in in-process

K. Vacharanukul; S. Mekid

A new probe for non-contact measurement of radius and roundness in in-process

K. Vacharanukul^*
, S. Mekid

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A non-contact laser based probe capable of dimensional as well as error of form measurements of a workpiece being machined has been developed and presented in this paper. This probe is able to achieve dynamic error compensation in CNC machine tools. The measurements are achieved in in-process and are automatically fed back to the machine controller for intelligent error compensations. The measurements are traceable to standards of frequency allowing higher precision. Based on a well-resolved laser Doppler technique and real time data acquisition, the probe delivers a very promising dimensional uncertainty at around 3 microns over a range of 100 mm for dimensional inspection and a corresponding roundness uncertainty of 0.25 μm.

Original language	English
Title of host publication	Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007
Editors	E. Thornett
Publisher	euspen
Pages	296-299
Number of pages	4
ISBN (Electronic)	0955308224, 9780955308222
State	Published - 2007
Externally published	Yes

Publication series

Name	Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007
Volume	2

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

ASJC Scopus subject areas

General Materials Science
Instrumentation
Environmental Engineering
Industrial and Manufacturing Engineering
Mechanical Engineering

Cite this

Vacharanukul, K., & Mekid, S. (2007). A new probe for non-contact measurement of radius and roundness in in-process. In E. Thornett (Ed.), Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007 (pp. 296-299). (Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007; Vol. 2). euspen.

Vacharanukul, K. ; Mekid, S. / A new probe for non-contact measurement of radius and roundness in in-process. Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007. editor / E. Thornett. euspen, 2007. pp. 296-299 (Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007).

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title = "A new probe for non-contact measurement of radius and roundness in in-process",

abstract = "A non-contact laser based probe capable of dimensional as well as error of form measurements of a workpiece being machined has been developed and presented in this paper. This probe is able to achieve dynamic error compensation in CNC machine tools. The measurements are achieved in in-process and are automatically fed back to the machine controller for intelligent error compensations. The measurements are traceable to standards of frequency allowing higher precision. Based on a well-resolved laser Doppler technique and real time data acquisition, the probe delivers a very promising dimensional uncertainty at around 3 microns over a range of 100 mm for dimensional inspection and a corresponding roundness uncertainty of 0.25 μm.",

author = "K. Vacharanukul and S. Mekid",

year = "2007",

language = "English",

series = "Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007",

publisher = "euspen",

pages = "296--299",

editor = "E. Thornett",

booktitle = "Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007",

}

Vacharanukul, K & Mekid, S 2007, A new probe for non-contact measurement of radius and roundness in in-process. in E Thornett (ed.), Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007. Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007, vol. 2, euspen, pp. 296-299.

A new probe for non-contact measurement of radius and roundness in in-process. / Vacharanukul, K.; Mekid, S.
Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007. ed. / E. Thornett. euspen, 2007. p. 296-299 (Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A new probe for non-contact measurement of radius and roundness in in-process

AU - Vacharanukul, K.

AU - Mekid, S.

PY - 2007

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N2 - A non-contact laser based probe capable of dimensional as well as error of form measurements of a workpiece being machined has been developed and presented in this paper. This probe is able to achieve dynamic error compensation in CNC machine tools. The measurements are achieved in in-process and are automatically fed back to the machine controller for intelligent error compensations. The measurements are traceable to standards of frequency allowing higher precision. Based on a well-resolved laser Doppler technique and real time data acquisition, the probe delivers a very promising dimensional uncertainty at around 3 microns over a range of 100 mm for dimensional inspection and a corresponding roundness uncertainty of 0.25 μm.

AB - A non-contact laser based probe capable of dimensional as well as error of form measurements of a workpiece being machined has been developed and presented in this paper. This probe is able to achieve dynamic error compensation in CNC machine tools. The measurements are achieved in in-process and are automatically fed back to the machine controller for intelligent error compensations. The measurements are traceable to standards of frequency allowing higher precision. Based on a well-resolved laser Doppler technique and real time data acquisition, the probe delivers a very promising dimensional uncertainty at around 3 microns over a range of 100 mm for dimensional inspection and a corresponding roundness uncertainty of 0.25 μm.

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T3 - Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007

SP - 296

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BT - Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007

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Vacharanukul K, Mekid S. A new probe for non-contact measurement of radius and roundness in in-process. In Thornett E, editor, Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007. euspen. 2007. p. 296-299. (Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007).

A new probe for non-contact measurement of radius and roundness in in-process

Abstract

Publication series

UN SDGs

ASJC Scopus subject areas

Fingerprint

Cite this