A method for constructing multi-layered thickness profiles from micro-PIXE line-scans

J. Nickel*, A. N. Shuaib

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations

Abstract

A method of converting the lateral X-ray yield intensity distributions from micro-PIXE line-scans into multi-layered thickness profiles is proposed. The method is demonstrated by the construction of multi-layered wear patterns of the flank faces of two types of TiN-coated high-speed steel (HSS) drills used in machining stainless steel workpieces. The wear features consist of three layers, namely the tool substrate, the TiN-coating and the adhered workpiece material. Differences in the wear patterns of the drills were identified from the obtained multi-layered thickness profiles.

Original languageEnglish
Pages (from-to)729-735
Number of pages7
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume158
Issue number1-4
DOIs
StatePublished - 1999

Bibliographical note

Funding Information:
The authors would like to acknowledge the support of King Fahd University of Petroleum and Minerals through the Center for Applied Physical Sciences of the Research Institute and the Mechanical Engineering Department. Professor B.S. Yilbas is gratefully acknowledged for providing the pre-nitrided drills used in the machining experiments.

Keywords

  • HSS drills
  • Micro-PIXE
  • Multi-layer
  • Thickness profiles
  • TiN-coating
  • Tool wear

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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