A finite state machine based fault tolerance technique for sequential circuits

Aiman H. El-Maleh*, Ayed S. Al-Qahtani

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

With technology advancement at the nanometer scale, systems became more subjected to higher manufacturing defects and higher susceptibility to soft errors. Currently, soft errors induced by ion particles are no longer limited to a specific field such as aerospace applications. This raises the challenge to come up with techniques to tackle soft errors in both combinational and sequential circuits. In this work, we propose a finite state machine (FSM) based fault tolerance technique for sequential circuits. The proposed technique is based on adding redundant equivalent states to protect few states with high probability of occurrence. The added states guarantee that all single faults occurring in the state variables of highly occurring states or in their combinational logic are tolerated. The proposed technique has minimal area overhead as only few states need protection.

Original languageEnglish
Pages (from-to)654-661
Number of pages8
JournalMicroelectronics Reliability
Volume54
Issue number3
DOIs
StatePublished - Mar 2014

Bibliographical note

Funding Information:
This work is supported by King Fahd University of Petroleum & Minerals under Project# SB100006.

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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