A complexity analysis of sequential ATPG

Thomas E. Marchok; Aiman El-Maleh; Wojciech Maly; Janusz Rajski

doi:10.1109/43.543773

A complexity analysis of sequential ATPG

Thomas E. Marchok^*
, Aiman El-Maleh
, Wojciech Maly
, Janusz Rajski

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

The research reported in this paper has been conducted to identify those attributes, of both sequential circuits and structural, sequential automatic test pattern generation algorithms, which can lead to extremely long test generation times. The retiming transformation is used to create families of circuits which have the same sequential depth and number and length of cycles, but a significantly different percentage of valid states. It was observed for three different sequential test pattern generators that the increase in complexity of test pattern generation is related to a new circuit attribute, termed density of encoding, and not to the sequential depth or number and length of cycles - i.e., those circuit parameters to which the complexity of test pattern generation has traditionally been attributed.

Original language	English
Pages (from-to)	1409-1423
Number of pages	15
Journal	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume	15
Issue number	11
DOIs	https://doi.org/10.1109/43.543773
State	Published - 1996
Externally published	Yes

Bibliographical note

Funding Information:
Manuscript received Fcbrnary 6, 1995; revised June 28, 1996. This work was supported in part by the Semiconductor Research Corp. under Contract 95-DC-068, Intcl Corp., and a Research Grant from the Natural Sciences and Engineering Research Council of Canada. This paper was recommended by Associate Editor K.-T. Cheng.

Keywords

S 0278-0070(96)07769-X

ASJC Scopus subject areas

Software
Computer Graphics and Computer-Aided Design
Electrical and Electronic Engineering

Access to Document

10.1109/43.543773

Cite this

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A complexity analysis of sequential ATPG

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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