Research output: Patent
}
TY - PAT
T1 - A combined Image Processing-Artificial Neural Networks Method for Estimating Contamination on High voltage Insulators
AU - Maraaba, Luqman
AU - Al-Hamouz, Zakariya
PY - 2016
Y1 - 2016
M3 - Patent
M1 - US9384560
ER -